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Technoorg Linda Co Ltd
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Ion Beam Applications S.A. (IBA
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SPECTRO Analytical
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Tectra GmbH
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ELIONIX INC
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ULVAC
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Tower Optical Corporation
two 1-inch diameter, 3 mm thick, ion beam sputtered ar-coated (r<0.02%) fused-silica windows Two 1 Inch Diameter, 3 Mm Thick, Ion Beam Sputtered Ar Coated (R<0.02%) Fused Silica Windows, supplied by Tower Optical Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/energy+ar+ion+beam/two+1+inch+diameter++3+mm+thick++ion+beam+sputtered+ar+coated++r+0+02+++fused+silica+windows/10__1364_slash_oe__435006-46-15-17 Average 90 stars, based on 1 article reviews
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ULVAC
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Tectra GmbH
defocused ion beam extracted from a gridded multi-aperture ar+ source Defocused Ion Beam Extracted From A Gridded Multi Aperture Ar+ Source, supplied by Tectra GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/energy+ar+ion+beam/defocused+ion+beam+extracted+from+a+gridded+multi+aperture+ar++source/10__3390_slash_app7040355-36-24-28 Average 90 stars, based on 1 article reviews
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ULVAC
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ULVAC
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Image Search Results
Journal: Heliyon
Article Title: Highly reflective silver mirror enhanced by several dielectric films prepared under the low substrate temperature
doi: 10.1016/j.heliyon.2024.e35507
Figure Lengend Snippet: Atomic concentrations at different sputtering times in XPS depth profiling of the topmost Nb 2 O 5 –SiO 2 layers in sample 3.
Article Snippet: For XPS depth profiling, the Versa Probe III was equipped with
Techniques:
Journal: Heliyon
Article Title: Highly reflective silver mirror enhanced by several dielectric films prepared under the low substrate temperature
doi: 10.1016/j.heliyon.2024.e35507
Figure Lengend Snippet: Atomic concentrations at different sputtering times in XPS depth profiling of sample 4.
Article Snippet: For XPS depth profiling, the Versa Probe III was equipped with
Techniques: